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Application instructions for hot and cold test of electronic components

The hot and cold test of electronic components is a high and low temperature test device for materials in the semiconductor industry. The research on high temperature semiconductors is currently focused on semiconductor magnetic levitation and high temperature semiconductor films. High-temperature semiconductor films have superior electrical properties that are difficult to compare with conventional materials. Some semiconductor devices fabricated by them are irreplaceable by other devices. Semiconductor quantum interference devices can be used as weak electromagnetic signal detection devices for medical, geological, materials, communication, etc. Providing a new and powerful means; in the microwave band, its surface resistance is several orders of magnitude smaller than that of conventional metal materials. Microwave devices made of HTS films such as resonators, filters, delay lines, antennas, phases Shifters and the like have quite good performance and have been widely studied and applied. Especially in some places where the performance of the device is demanding, such as satellite communication, military communication equipment, mobile communication base station, etc., the hot and cold test of electronic components shows a good application prospect.

The hot and cold test of electronic components can realize the required low temperature conditions conveniently and quickly, which is beneficial to the theoretical and applied research of high temperature semiconductors. At the same time, the electronic component cold and hot test can also provide a low temperature, high vacuum environment. The hot and cold test of electronic components is suitable for the measurement of the conductive properties of conductive materials, the luminescence properties and radiation absorption properties of luminescent materials, and the temperature resistance test of high and low temperature materials. The vacuum chamber can be modified to mechanical properties of materials at various temperatures. test.

Some special materials must prevent the air from oxidizing, adsorbing and other pollution effects. The electronic component hot and cold test system can provide a high vacuum environment and minimize the factors that may affect the measurement. The radiant heater adopts high melting point and low volatility quartz glass as the outer shell, which not only plays a role of heating, but also reduces the possibility of releasing gas from the heating source, and reduces the pollution that may be caused by the heating source in the high temperature test. To a minimum.

The cold and hot test of electronic components is developed and produced by LNEYA. It can test various semiconductor materials and is easy to use. It is used in low temperature, high temperature semiconductor and various materials research.

(Note: Some of the original content is from related papers. If infringement, please contact us in time to delete, thank you.)

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