The chip aging test chamber is a device specifically designed to simulate the working state of chips in extreme environments. By accurately controlling environmental parameters such as temperature and humidity, it simulates the extreme conditions such as high temperature, high humidity, and high stress that chips may encounter in actual use, accelerating the aging process of chips. Through this method, early failure chips can be screened in a short period of time, optimizing design schemes, improving product yield, and ensuring the stability and reliability of chips in long-term use.